Overview: We have developed an accurate fault modeling tool to capture variation-induced faults in Networks-on-Chip (NoCs). The core of our fault model has circuit-level accuracy, while its ...

Traditional IC pattern-generation methods focus on detectingdefects at gate terminals or at interconnects. Unfortunately, a significantpopulation of defects may occur within an IC's gates, or cells.

A research team led by the University of Sharjah in the United Arab Emirates has developed a novel machine learning approach for fault detection in bifacial PV systems. The method combines a ...

A team of scientists in the United States has combined both spatial and temporal attention mechanisms to develop a new approach for PV inverter fault detection. Training the new method on a dataset ...

An analysis of the response of buried continuous pipelines to active faults has led to development of a design guideline for both onshore and offshore pipelines at fault crossings. A fault movement ...

As semiconductor applications in automotive, data center, and high-performance computing grow increasingly mission-critical, the industry faces mounting pressure to achieve near-perfect manufacturing ...