IEEE

Image2Net: Datasets, Benchmark and Hybrid Framework to Convert Analog Circuit Diagrams into Netlists

Abstract: Large Language Model (LLM) exhibits great potential in designing of analog integrated circuits (IC) because of its excellence in abstraction and generalization for knowledge. However, ...
IEEE

Robust Open-Circuit Fault Diagnosis for PMSM Drives Using Wavelet Convolutional Neural Network With Small Samples of Normalized Current Vector Trajectory Graph

Abstract: Open-circuit fault is one of the most common faults in permanent-magnet synchronous machine (PMSM) drives. The open-circuit fault can cause the obvious change of stator currents of the PMSM.