Zeiss Microscopy, Jena, Germany, a manufacturer of visible, electron, X-ray and ion microscope systems, has added two super-resolution microscopes to its structured illumination microscopy (SIM) range ...

The Carl Zeiss AURIGA CrossBeam Focused Ion Beam Electron Microscope is a state-of-the-art advanced scanning electron microscope integrated with high-resolution focused ion beam milling that enables ...

Universal software designed to operate any ZEISS light or electron microscope Easy navigation, streamlined SEM operation, and integrated EDS analysis Solution for connected microscopy WHITE PLAINS ...

Carl Zeiss launches Axioskop 2 MAT, a routine microscope boasting improved optical capabilities to meet the increasing demands made by materials scientists. The microscope features two unique Carl ...

With Airyscan, ZEISS introduced a new detector concept for confocal laser-scanning microscopy (LSM). Whereas traditional LSM designs use a combination of pinhole and single-point detectors ...