Fitting of full X-ray diffraction patterns is an effective method for quantifying abundances during X-ray diffraction (XRD) analyses. The method is based on the principal that the observed diffraction ...

Abstract: A method to obtain a nano-area electron diffraction pattern in transmission electron microscopy (TEM) was proposed, based on three-dimensional (3D) image formation theory. This method allows ...

Department of Chemistry, University of Oxford, Inorganic Chemistry Laboratory, South Parks Road, Oxford OX1 3QR, U.K. The Faraday Institution, Quad One, Harwell ...

Institute of Chemistry and Biochemistry, Freie Universität Berlin, Fabeckstraße. 34-36, 14195 Berlin, Germany ...

The software ReciPro makes various crystallographic calculations, visualizes a crystal structure, simulates a diffraction pattern and high-resolution TEM image, indexes diffraction spots, plots ...

A cross-platform, open-source library for the analysis of X-ray diffraction data.

Laboratory of Integrated Exploitation of Bayan Obo Multi-Metal Resources, Inner Mongolia University of Science and Technology, Baotou 014010, P. R. China School of Materials and Metallurgy, Inner ...