Return to original Test Digest book review. VLSI Test Principles and Architectures: Design for Testability, Laung-Terng Wang, Chen-Wen Wu, and Xiaoquing Wen (editors), Elsevier Science ...
In the dynamic world of VLSI (Very Large-Scale Integration), the demand for innovative products is higher than ever. The journey from a concept to a fully functional product involves many challenges ...
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